Physical Electronics nanoTOF

Equipment Type

Time of Flight – Secondary Ion Mass Spectrometer

Manufacturer

Physical Electronics

Model

Physical Electronics nanoTOF

Location

Surface Science Suite

PHI’s patented triple focusing time-of-flight (TRIFT) mass spectrometer provides superior sensitivity and the unique ability to image highly topographic surfaces. The nanoTOF can be configured with a wide variety of options to optimize performance for organic materials, inorganic materials, or both, depending on customer requirements. The nanoTOF performs parallel detection of all elements from hydrogen to uranium, detection and identification of molecules from exact mass and characteristic fragments elemental and molecular imaging with spatial resolution down to 70 nm.

Manufacturer’s Page

Specifications

  • TRIFT mass analyzer
  • 30 kV LMIG with Bi emitter (optional Au or Ga)
  • Dual beam charge neutralization
  • In-situ optical viewing
  • Secondary electron detector
  • 20 kV C60 + ion gun
  • 20 kV Ar2500+ gas cluster ion gun