Time of Flight – Secondary Ion Mass Spectrometer
Physical Electronics nanoTOF
Surface Science Suite
PHI’s patented triple focusing time-of-flight (TRIFT) mass spectrometer provides superior sensitivity and the unique ability to image highly topographic surfaces. The nanoTOF can be configured with a wide variety of options to optimize performance for organic materials, inorganic materials, or both, depending on customer requirements. The nanoTOF performs parallel detection of all elements from hydrogen to uranium, detection and identification of molecules from exact mass and characteristic fragments elemental and molecular imaging with spatial resolution down to 70 nm.