Transmission Electron Microscope
Titan Themis 200
The Titan Themis 200 S/TEM provides high-throughput sub-Angstrom imaging for atomic 2D and 3D analysis. It combines proven spherical aberration (Cs) corrector, sensitive ChemiSTEM™ technology with an enhanced piezo stage, new 4k x 4k Ceta 16M CMOS camera to deliver the best S/TEM image quality for rapid, easy access to atomic scale information to researchers in materials science. Thanks to recent developments of high-brightness X-FEG that generates up to 5 times more beam current at a given spatial resolution compared to a conventional FEG and high-efficiency SuperX X-ray detection system that collects up to 10 times more x-ray than conventional detector, ChemiSTEM™ technology brings order-of-magnitude improvement in sensitivity and speed in EDS analysis.