Imaging Facility Tools

  • FEI Helios NanoLab 660 SEM/FIB

    The FEI Helios NanoLab 660 features the most recent advances in field emission SEM (FESEM) and focused ion beam (FIB) technologies and their combined use. This DualBeam SEM/FIB is designed for demanding nanoscale work, resolving the finest details in 2D and 3D with clearest contrast, preparing the thinnest and highest quality samples, and most rapidly creating prototype devices with critical dimensions of a few nanometers only.

  • FEI Tecnai G2 Spirit TWIN Transmission Electron Microscope (TEM)

    The Tecnai Spirit TWIN TEM is a general-purpose high resolution 120 kV TEM for screening and training purpose at both ambient and cryogenic conditions. It is designed with high-level of automation to meet the stringent demands of life science and material research. The Spirit produces excellent 2D and 3D images due to special automated and […]

  • FEI Titan Halo 80-300 Transmission Electron Microscope (TEM)

    The FEI Titan Halo is a powerful and flexible high resolution, 300 kV, electron microscope for various characterizations of biological and materials oriented samples at both ambient and cryogenic conditions.

  • FEI Titan Themis 200 TEM

    The FEI Titan Themis 200 is a 200 kV transmission electron microscope that has been developed for stability and flexibility. With a Cs corrected platform to deliver the fastest time to data with high image quality, the FEI Titan Themis 200 performance enables atomic scale discovery and exploration. This microscope can deliver fast, precise and quantitative materials characterization in multiple dimensions at the physical edge of today’s achievable resolution power.

  • Leica TCS SP8 STED 3X

    The TCS SP8 STED 3X, the newest generation of STED (Stimulated Emission Depletion) microscopy by Leica Microsystems, provides super-resolution imaging in all dimensions. The integrated STED system meets the requirements of daily scientific research and provides fast, intuitive, and pure optical access to structural details beyond the diffraction limit. STED 3X broadens the scope of super-resolution microscopy by offering the whole spectrum of visible light. It is able to reach lateral (XY) resolution of ~50 nm and axial (Z) resolution of ~150nm.

Other instrumentation:

FEI Vitrobot IV: Cryo-EM sample preparation

Fischione M1070 NanoClean: plasma cleaning

Leica EMACE200 coater: carbon coating and sputter coating (Au or Pt)

Contact Us:

FEI Titan Halo 80-300
Leica STED
FEI Spirit TWIN

Primary Contact: Tong Wang (Tong.Wang@asrc.cuny.edu)

FEI Helios Nanolab 660
FEI Titan Themis 200

Primary Contact: Sheng Zhang (Sheng.Zhang@asrc.cuny.edu)